The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 1997

Filed:

Jun. 01, 1995
Applicant:
Inventors:

Morton L Barr, Rockaway, NJ (US);

Paul J Vincenti, Jefferson, NJ (US);

Elaine L Vanderhoof, Long Valley, NJ (US);

Assignee:

The Mennen Company, Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C01B / ; C01F / ; A61K / ;
U.S. Cl.
CPC ...
423412 ; 423385 ; 423395 ; 423400 ; 423462 ; 423463 ; 424 65 ; 424 68 ;
Abstract

Disclosed are basic aluminum antiperspirant materials having univalent complex oxoanions (e.g., nitrate); methods of making such materials; antiperspirant compositions containing such basic aluminum materials, another antiperspirant active material (e.g., a basic zirconium halide salt), and optionally a neutral amino acid; and methods of making such compositions. Size exclusion high performance liquid chromatography chromatograms of the disclosed basic aluminum materials have a peak 4 relative area of at least 25%, a peak 3 relative area of less than 60%, the sum of the peaks 3 and 4 being at least 50%; and less than 10% of the chromatographic peaks eluting at peaks 1 and 2. The disclosed basic aluminum materials have less than 25% of the aluminum in the form of Al.sup.b polyhydroxyaquoaluminum, and have a .sup.27 Al NMR spectrum in which the area of the 71.5-73.5 ppm resonance line includes more than 50% of the combined areas of the 62.5-63.5 ppm and 71.5-73.5 ppm resonance lines, and 5%-30% of the total area under the spectrum from 140 ppm to -80 ppm is contained in the resonance line at 71.5-73.5 ppm. The basic aluminum material of the present invention can be produced by adding a stoichiometric or near-stoichiometric amount of aluminum metal to a solution of an aluminum salt having a univalent complex oxoanion; the basic aluminum material can also be made by adding to such solution of the aluminum salt, aluminum metal having, in total, a relatively small surface area (large-sized particles of aluminum).


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