The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 1997

Filed:

May. 22, 1995
Applicant:
Inventors:

Thanh A Diep, Stanford, CA (US);

Hadar I Avi-Itzhak, Mountain View, CA (US);

Harry T Garland, Los Altos Hills, CA (US);

Assignee:

Canon Inc., Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T / ;
U.S. Cl.
CPC ...
382157 ; 382216 ; 395 23 ;
Abstract

Pattern recognition, for instance optical character recognition, is achieved by training a neural network, scanning an image, segmenting the image to detect a pattern, preprocessing the detected pattern, and applying the preprocessed detected pattern to the trained neural network. The preprocessing includes determining a centroid of the pattern and centrally positioning the centroid in a frame containing the pattern. The training of the neural network includes randomly displacing template patterns within frames before applying the template patterns to the neural network.


Find Patent Forward Citations

Diep, Thanh. (1997). Training a neural network using centroid dithering by randomly (U.S. Patent No. 5625707). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5625707

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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