The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 1997

Filed:

May. 31, 1995
Applicant:
Inventors:

Shih-Jong J Lee, Bellevue, WA (US);

Dayle G Ellison, Redmond, WA (US);

Paul S Wilhelm, Kirkland, WA (US);

Assignee:

NeoPath, Inc., Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382128 ; 382133 ;
Abstract

An automated laboratory process monitoring method for a computer controlled automated cytology system initializes lab process assessment slide data so as to produce an initial batch of qualified slides. Monitor parameters are extracted from the initial batch of qualified slides so as to determine control limits. Field data is monitored by comparing the field data to the control limits.


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