The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 1997

Filed:

Jun. 30, 1995
Applicant:
Inventor:

Heang K Tuy, Chesterland, OH (US);

Assignee:

Picker International, Inc., Highland Heights, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
378 15 ; 378901 ;
Abstract

A two-dimensional radiation detector (30) receives divergent ray penetrating radiation along conical or pyramidal ray paths which converge at an apex. The radiation may emanate from one or both of an x-ray tube (16) or radionuclei injected into a human subject. As the radiation detector rotates around the subject, it is repeatedly sampled to generate two-dimensional data sets h.sub.t (u,v) at each of a plurality of samplings t. Each two-dimensional data array is weighted (44) and divided into two components. A first component processor (48) convolves a first component of each two-dimensional array with respect to u for each v. A second component processor (50) processes a second component of each two-dimensional array (FIG. 6) including weighting each component with a geometrically dependent weighting function W from a weighting function computer (46). The processed first and second components are combined (52) and backprojected (54).


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