The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 1997

Filed:

Mar. 14, 1995
Applicant:
Inventors:

Yoshiki Shimomura, Osaka, JP;

Sadao Tanigawa, Osaka, JP;

Yukihiro Mori, Osaka, JP;

Toshimitsu Takakura, Osaka, JP;

Yasushi Umeda, Tama, JP;

Tetsuo Tomiyama, Tokyo, JP;

Hiroyuki Yoshikawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G / ;
U.S. Cl.
CPC ...
399 42 ; 395904 ;
Abstract

The present invention makes it possible to make good self-repair on which little secondary effect is exerted by calculating a manipulated variable of a parameter at the time of the repair by a functional amount in an image forming apparatus having a self-repair function. When a fault occurs, control-type repair for operating a physical parameter is first made. In this repair, the physical parameter to be operated is searched for (n3). If the physical parameter to be operated is determined, a manipulated variable of the physical parameter is then calculated by a functional amount (n4). The manipulated variable of the parameter by the functional amount is determined by adjusting the degree to which a plurality of functions are developed. Therefore, a manipulated variable in which the development of the functions is most preferable as the entire apparatus is determined. If the fault cannot be repaired by the control type repair, functional redundancy type repair is made (n6, n7, n8, n9). In the functional redundancy type repair, priorities to repair candidates are determined by the functional amount.


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