The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 1997

Filed:

Jul. 25, 1995
Applicant:
Inventors:

Nobuyoshi Nakajima, Kanagawa-ken, JP;

Daigo Ezuka, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382295 ;
Abstract

Reference regions are set in a radiation image, which serves as a reference among a plurality of radiation images, and template regions are set in the other radiation images. An orthogonal coordinate system is defined on each of the plurality of the radiation images. First template matching is carried out in order to match the template regions to the reference regions. Factors of affine transformation are calculated, and first affine transformation is carried out, with which at least the correction with a rotating operation and the correction with an enlargement or reduction factor are carried out on the radiation images containing the template regions. Second template matching is then carried out on the radiation images, which have been obtained from the first affine transformation. The factors of affine transformation are calculated, and second affine transformation is then carried out, with which the correction with the rotating operation, the correction with the enlargement or reduction factor, and the correction with a parallel translation are carried out on the radiation images containing the template regions.


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