The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 1997
Filed:
Jun. 27, 1994
Ya-Tien Ko, Manalapan, NJ (US);
Sanjoy Paul, Atlantic Highlands, NJ (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
A method and apparatus for generating a conformance test data sequence of minimal length to verify that a device conforms to a protocol entity which can be characterized by a simplified extended finite state machine. The method generates an expanded directed graph of the protocol wherein each state is represented by a state vertex and a dummy vertex which are connected to other similar state and dummy vertices by directed edges in a configuration corresponding to the operation of the machine. The directed edges are then assigned traversal numbers corresponding to the minimum number of times a respective directed edge need be traversed in order to test values in a predetermined test data set. The traversal numbers of the expanded directed graph are balanced to form a symmetric expanded directed graph. An Euler tour and a corresponding unique input-output sequence of the last state of the Euler tour are generated to form the conformance test data sequence. The generated conformance test data sequence exhaustively tests the values in the test data set, and achieves an efficiency in conformance testing by minimizing the amount of time required to perform the conformance test.