The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 1997
Filed:
Sep. 16, 1994
Applicant:
Inventor:
Kiyoshi Yoda, Hyogo, JP;
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364553 ; 364149 ;
Abstract
Disclosed herein is a method and an apparatus for controlling or determining and estimating an object system which controls or determines parameters for specifying the object system and estimates an internal condition of the object system based on a measured value obtained for the object system. The method and apparatus compute a function characteristic distribution of the object system as a function of variable parameters using a boundary element method or finite element method. An equation is set by making equivalance between the computed distribution and a predetermined distribution. Values of parameters can be obtained by solving the equation.