The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 1997

Filed:

Jul. 21, 1995
Applicant:
Inventors:

Yukio Arima, Thukuba, JP;

Toshihiro Kimura, Ibaraki-ken, JP;

Yuichi Kunitomo, Tsuchiura, JP;

Tadatoshi Shimamura, Ishioka, JP;

Takeshi Nishiduka, Ibaraki-ken, JP;

Ken Takeuchi, Tsuchiura, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73611 ; 73613 ;
Abstract

In an ultrasonic inspection and imaging instrument, a pulse generator and a burst wave generator are provided in association with the activation of an ultrasonic probe by the pulse generator and in response to a measurement value obtained from a signal reception circuit portion. A first gate position is obtained with regard to an inspection portion in a sample, and then a second gate position for a burst wave measurement is set by correcting the first gate position. The burst wave measurement is performed by activating the burst wave generator.


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