The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 1997
Filed:
Oct. 04, 1995
Applicant:
Inventors:
Assignee:
Leica AG, Vienna, AT;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
359368 ; 356140 ;
Abstract
A protraction device for a measuring microscope comprises a reticle aligned on an optical path of the microscope at an intermediate image plane thereof and adapted for rotation about a central axis, and an angle encoder operably coupled to the reticle such that when the angle encoder is rotated about its rotational axis, a corresponding rotation is produced in the reticle. The angle encoder provides a signal representative of an angular displacement of the reticle which is delivered to a printer, digital display, or the like.