The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 1997

Filed:

Mar. 20, 1995
Applicant:
Inventors:

Koji Oobayashi, Hiroshima, JP;

Satohiko Takanashi, Tsukuba, JP;

Muneharu Ishikawa, Tsukuba, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356336 ; 356338 ; 356339 ; 356352 ;
Abstract

A particle-containing fluid in a sample cuvette is irradiated by a laser beam from a light source section. The scattered light thus produced passes through converging lenses and a mask and impinges on an etalon interferometer. The etalon only transmits scattered light (Rayleigh scattered light) that is of the same wavelength as the light emitted by the laser light source. The transmitted scattered light components impinges on a photomultiplier, and based on the intensity of the light a calculating section sorts the particles according to size and calculates the number of particles per unit flow amount, the particle size distribution and so forth. To enable adjustments to be made to compensate for the environmental dependency characteristics of the etalon, a control unit is provided which consists of a photodiode and mirrors.


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