The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 1997
Filed:
Apr. 12, 1995
Honeywell AG, Offenbach, DE;
Abstract
An apparatus evaluates measuring values from a laminar material, wherein the laminar material is moving in a single plane in a predetermined direction, the laminar material being moved also being under test. The apparatus comprises a measuring platform which is being moved traverse to a direction of movement of the laminar material. Further, the measuring platform is tiltable about an axis which is normal to a plane of the laminar material, an angle of tilt (a) being determined by a traversing velocity (v.sub.t) of the measuring platform and velocity (v.sub.b) of the predetermined direction of the laminar material. A plurality of separated sensors and radiation emitters are mounted on the measuring platform, and in conjunction with the angle of tilt cause, the measuring valves acquired from the different sensors to be from the same measuring spot of the laminar material.