The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 1997
Filed:
May. 17, 1995
Applicant:
Inventors:
Takashi Shionoya, Kawasaki, JP;
Junji Ikeda, Yokohama, JP;
Assignee:
Nikon Corporation, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G11B / ;
U.S. Cl.
CPC ...
385132 ; 385 11 ; 385 14 ; 385 27 ; 385 28 ; 385 40 ; 359368 ; 359370 ; 359371 ; 369112 ; 369110 ;
Abstract
This laser scanning microscope has a second light source for emitting second light into one of branch channel waveguides, and a third photodetector for detecting a light intensity distribution formed on the end face of the trunk channel waveguide based on the second light, and a controller for controlling the voltage to be applied from a voltage application unit to electrode on the waveguide in accordance with the output signal from the third photodetector.
Shionoya, Takashi. (1997). System for detecting an optical information and scanning microscope (U.S. Patent No. 5617500). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5617500
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile