The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 1997

Filed:

Jul. 12, 1995
Applicant:
Inventors:

Sherif Makram-Ebeid, Dampierre, FR;

Jacques Breitenstein, Saint-Maur-des-Fosses, FR;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 62 ; 382132 ;
Abstract

A method of processing images in order automatically to detect key pixels (K.sub.2, K.sub.3, K.sub.4) situated on the contour of an object (LV) in an initial image (I.sub.0), and a device for implementing this method in which there is storage, in the digitized initial image (I.sub.0), of the intensity of the pixels [A.sub.0 (x,y)] and of data of regions of the object (LV), classes (C.sub.1 C.sub.m); selection of pixels of interest (PI), on the contour, inside and outside the object (LV); generation of characteristics (E.sub.1 E.sub.k) for each of the pixels of interest (PI); classification of the pixels of interest (PI) into the classes (C.sub.1 C.sub.m); and selection of the key pixels (K.sub.2, K.sub.3, K.sub.4) from corresponding classes (C.sub.2, C.sub.3, C.sub.4).


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