The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 1997

Filed:

Mar. 09, 1995
Applicant:
Inventors:

Craig H Meyer, Palo Alto, CA (US);

Pablo Irarrazabal, Stanford, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324320 ; 324309 ; 1286532 ;
Abstract

A fast and robust method for correcting magnetic resonance image distortion due to field inhomogeneity is applied to spiral k-space scanning. The method includes acquiring a local field map, finding the best fit to a linear map, and using the linear field map to deblur the image distortions due to local frequency variations. The linear field map is determined using a maximum likelihood estimator with weights proportional to the pixel intensity. The method requires little additional computation and is robust in low signal regions and near abrupt field changes. The application of this method is illustrated in conjunction with a multi-slice, T2-weighted, breath-held spiral scan of the liver.


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