The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 1997
Filed:
Jul. 11, 1995
John A Reffner, Stamford, CT (US);
Milan Milosevic, Fishkill, NY (US);
Donald W Sting, New Canaan, CT (US);
Other;
Abstract
An apparatus and method for spectroscopic or radiometric analysis of solid, liquid, or gas samples includes first and second optically transmitting materials. The first optically transmitting material has selected bulk optical transmission and index of refraction properties which enable infrared radiation transmission therethrough across selected optical transmission ranges. The first optically transmitting material is of a type which normally has chemical or mechanical degradation when in contact with the sample during spectroscopic or radiometric analysis. The second optically transmitting material is preferably a wafer or thin sheet in optical/mechanical contact with the first optically transmitting material. The second material is designed to be located between the first optically transmitting material and the sample all held in a fixture or fixtures to prevent the sample from contacting the first material during spectroscopic or radiometric analysis of the sample. The second optically transmitting material: i) is chemically resistant to the sample, ii) is constructed of a material which prevents significant physical degradation of the second material when the sample contacts the second material, iii) has selected optical transmission and index of refraction properties which enable optical transmission from the first material to the second material, or from the second material to the first material, without significant transmission or reflectivity losses, and iv) is contained in a cell or fixture that prevents the sample from contacting the first optically transmitting material during the spectroscopic or radiometric analysis.