The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 1997

Filed:

Feb. 14, 1996
Applicant:
Inventors:

Haruji Tsubota, Tokyo, JP;

Naoya Sasaki, Tokyo, JP;

Assignee:

Kajima Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L / ;
U.S. Cl.
CPC ...
73 37 ; 73159 ; 73786 ; 73837 ;
Abstract

A device for measuring woven fabric stress. The device includes a vacuum chamber having high rigidity; a vacuum pump for reducing the pressure in the vacuum chamber; a pressure gauge; a fabric displacement measuring device; and a fabric stress calculator. The vacuum chamber has an opening for sealing engagement with a surface of a fabric under atmospheric pressure. Upon evacuating the air from the vacuum chamber, the atmospheric pressure against the opposite surface of the fabric distends a portion of the fabric into the vacuum chamber. The measure of fabric distension and the reduced pressure reading in the vacuum chamber are transmitted to the fabric stress calculator, which compares the readings to compute a fabric stress reading.


Find Patent Forward Citations

Loading…