The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 1997
Filed:
Nov. 01, 1994
Hitachi Medical Corporation, Tokyo, JP;
Abstract
In a scattered X-ray correction method for an X-ray computerized tomograph, the quantity of X-rays passed through a phantom is measured to be converted into logarithms. Obtained from the logarithmic data is a scattered X-ray correction curve representing a relationship between the measured data in the logarithmic expression and an amount of scattered X-ray correction. For a subject, the quantity of X-rays penetrated therethrough is measured to be transformed into logarithms. From the measured data undergone the logarithmic conversion and the scattered X-ray correction curve, there is attained a scattered X-ray correction amount in a linear region which is the state before the logarithmic conversion. The measured data of the subject in the logarithmic expression is subjected to an inverse logarithmic conversion. From the obtained values, the scattered X-ray correction amount is subtracted such that the resultant values are again converted into logarithms, thereby producing a computerized tomogram from the logarithmic values.