The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 1997
Filed:
Feb. 09, 1994
Derek G Foster, Thousand Oaks, CA (US);
Edward K Siu, Simi Valley, CA (US);
Ben A Pierce, Ojai, CA (US);
Michael Kennedy, Ventura, CA (US);
Onofrio Schillaci, Camarillo, CA (US);
Alex Knight, Danville, IN (US);
Harris Corporation, Melbourne, FL (US);
Abstract
A processor-controlled integrated telephone line measurement and conditioning apparatus installable at a remote site provides a multiplicity of measurement and conditioning functions that are selectively executable in response to commands issued from a supervisory command site. The dual measurement and conditioning capabilities of the architecture of the present invention impart both remote measurement unit (RMU) functionality and metallic access unit (MAU) functionality that may be individually accessed and controlled. The RMU operates primarily as a test head that performs mechanized loop testing (MLT) tasks, while the MAU is operative to impart prescribed electrical conditions to a specified line circuit. When controllably accessed to operate as an RMU, the present invention responds to instructions from a command site (loop maintenance operations systems) and performs single-line demand tests on a line provided by a pair gain system. To operate as an MAU, the system receives commands from a direct access test unit (DATU) and performs line conditioning functions on the test line provided by the pair gain system.