The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 1997
Filed:
Dec. 01, 1994
Rick L Horne, Boynton Beach, FL (US);
Terence J Lohman, Boca Raton, FL (US);
Mark G Noll, Raleigh, NC (US);
Jose A Olive, Miami, FL (US);
Roberto V Perez, Boca Raton, FL (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and apparatus for bypassing a boundary-scan cell during functional operation of an electronic component provides a component output signal (such as a data signal) to a boundary-scan bypass circuit during normal functional operation of the electronic component. The component output signal is multiplexed in the bypass circuit with the test result signal that occurs during boundary-scan testing. During functional operation of the electronic component, the component output signal is selected and provided to an output latch that is clocked by a transition of the clock signal of the electronic component. By bypassing the component output signal around the boundary-scan cell during normal operation, the traversing of the multiplexer by the component output signal after the transition of the clock signal of the component is avoided, thereby reducing off-chip delay.