The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 1997

Filed:

Jun. 27, 1995
Applicant:
Inventors:

Kurt Rueb, Kitchener, CA;

Andrew Wong, Waterloo, CA;

Assignee:

Virtek Vision Corp., Waterloo, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356394 ; 356398 ; 356376 ;
Abstract

A system combines a galvanometer system with a camera to provide information from a workpiece to the camera. The galvanometer rotates mirrors to change the image that is directed from the workpiece into the camera. The inventive method allows the use of the camera to identify the location of points on the workpiece. Further, the system facilitates the use of the camera to store information about a pattern on a workpiece. Also, the system can be utilized to create a computer aided design file of the surface of a workpiece. The system is utilized in the last two methods to serially store bit by bit information about the workpiece in a memory.


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Rueb, Kurt. (1997). Galvanometer and camera system (U.S. Patent No. 5615013). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5615013

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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