The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 1997
Filed:
Apr. 12, 1996
Takeshi Sakura, Kyoto, JP;
Yutaka Yamasaki, Kyoto, JP;
Hiroko Kubo, Kyoto, JP;
Kexin Xu, Kyoto, JP;
Motonobu Shiomi, Neyagawa, JP;
Kyoto Daiichi Kagaku Co., Ltd., Kyoto, JP;
Kurashiki Boseki Kabushiki Kaisha, Okayama, JP;
Abstract
A method of quantitative analysis of a specific component of an object to be measured comprises steps of measuring an energy spectrum of light transmitted through or reflected from the object, dividing the energy spectrum into a plurality of wavelength domains, thereby obtaining a plurality of partial energy spectra, normalizing the plurality of partial energy spectra within each wavelength domain using an energy measured at a predetermined wavelength contained in each wavelength domain, and performing the quantative analysis by multivariate analysis using the plurality of partial energy spectra having been normalized.