The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 1997

Filed:

May. 17, 1995
Applicant:
Inventors:

Yoshimasa Matsuura, Honjo, JP;

Mikio Tagaya, Isesaki, JP;

Ryosaku Tagaya, Isesaki, JP;

Assignee:

Eisai Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356237 ; 356239 ;
Abstract

A light is illuminated, for example, from the side of a flange of a syringe. An imaging processing is carried out with an image signal issued by imaging a reflected light from the edge of flange by means of a TV camera or CCD camera located, for example, in an upward slant direction. Detecting an irregular state of the image signal caused by the reflected light, a crack or chip at the flange are recognized. The irregular state of the image signal, which is obtained by detecting parts where the light is not reflected, brings the method of being easy to detect the crack or chip at the flange.


Find Patent Forward Citations

Matsuura, Yoshimasa. (1997). Method of detecting crack and chip in flange of syringe (U.S. Patent No. 5615007). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5615007

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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