The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 1997

Filed:

Oct. 26, 1995
Applicant:
Inventors:

Hiroshi Iijima, Tokyo, JP;

Mineki Hayafuji, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351208 ;
Abstract

In order to detect an alignment state while watching an index image, illumination light is first projected onto an anterior segment of a subject's eye (E) from LEDs (21), and then light emitted by another LED (31) is guided to a cornea (C) through an alignment light projecting optical system (30). The light emitted by the LEDs (21, 31) and reflected by the subject's eye (E) is imaged on a CCD camera (26) through an image-formation optical system (20). An index image (SP) and an anterior segment image (E') which are of the reflection light guided to the CCD camera (26) are displayed on a screen (28). The index image (SP) is received by a sensor (46). Based on information about received light obtained by the sensor (46), a comparator (47) detects information about alignment of the subject's eye (E) with an instrument body. According to a detection result obtained by the comparator (47), a display state of the display (28) is changed, so that an operator judges that a desired state of alignment is nearing.


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