Cache testing using a modified snoop cycle command

Abstract

The cache controller of a second level cache in an Intel Pentium processor based computer system contains test circuitry that allows reading and writing directly into all tag RAM databit locations. This circuitry responds to a modified External Address Strobe (EADS#) command to invoke the tag test cycle. The EADS# command is normally used in a SNOOP read cycle by the system. In a SNOOP cycle, the main memory controller invokes the EADS# command to request the first level (L.sub.1) and second level (L.sub.2) caches for modified information stored in those caches. In the tag test cycle the EADS# command line is held down twice as long as it would in a normal SNOOP read Cycle. Because of its added length, the SNOOP cycle circuits in the L.sub.2 cache ignore the command on the EADS# command line. However, the tag RAM test circuitry in the L.sub.2 cache recognizes the extended EADS# strobe providing a path to access all bit locations in a tag RAM for both read and write cycles to test the tag RAM or to load those bit positions to selected states in testing other portions of the cache.