The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 1997
Filed:
Oct. 11, 1994
Yoshiki Shimomura, Osaka, JP;
Sadao Tanigawa, Osaka, JP;
Yukihiro Mori, Osaka, JP;
Yasushi Umeda, Tama, JP;
Tetsuo Tomiyama, Tokyo, JP;
Hiroyuki Yoshikawa, Tokyo, JP;
Mata Industrial, Co., Ltd., Osaka, JP;
Abstract
According to the present invention, a concept of functional quantities indicative of quantified functional degrees of such lower-level functions as 'clearer characters', 'cleaner background', and 'thicker characters', which are subordinating to a qualification-oriented function of 'more beautiful characters'. Characteristic patterns of functional quantities F1, F2 and F3 of the lower-level functions for physical parameters (for example, the surface potential of a photoreceptor body) are prepared. When a fault repair is implemented by changing a value of a physical parameter, a tradeoff occurs between lower-level functions which are influenced by the physical parameter. That is, taking into account the functional quantities F1, F2 and F3 of the lower-level functions, the value of the physical parameter is set so that the functional quantity of the function of 'more beautiful characters' is maximized. By introducing the concept of the functional quantities indicative of the quantified functional degrees of the functions, a flexible self-repairing function can be realized, thereby optimizing a repair operation.