The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 1997

Filed:

Sep. 07, 1994
Applicant:
Inventors:

Satoru Kumagai, Chigasaki, JP;

Hiroshi Ohki, Yokohama, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359385 ; 359386 ; 359740 ;
Abstract

A confocal microscope is adapted to prevent a shading phenomenon of an observation image due to axial chromatic aberration and chromatic aberration of magnification of an objective optical system. A backward light from a specimen illuminated by an excitation light through the objective optical system is condensed through the objective optical system and a deflecting optical system at a position conjugate to the condensing point on the specimen. Formed in a light shielding member aligned with the condensing point position of the backward light is a pinhole having an opening which substantially covers a range of movements of the condensing point of the backward light caused as a result of the movement of the optical path by the deflecting optical system. Alternatively, in order to reduce the amount of movement of the condensing point corresponding to the wavelength of the backward light to zero, a light deflecting element is arranged at a position displaced by a predetermined distance from a deflecting optical system-side focal position of the objective optical system or a position conjugate to the focal position.


Find Patent Forward Citations

Kumagai, Satoru. (1997). Confocal microscope (U.S. Patent No. 5612818). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5612818

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