The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 1997
Filed:
Mar. 23, 1995
Allen G Hirsh, Silver Spring, MD (US);
Organ, Inc., Chicago, IL (US);
Abstract
An apparatus and method for modified intrinsic state spectral analysis determines a proportion of a plurality of intrinsic structures of an optically active molecule. A spectropolarimeter generates a plurality of intrinsic spectra. Each of the plurality of intrinsic spectra is an intrinsic state vector corresponding to a plurality of intrinsic molecular structures. The spectropolarimeter also generates a spectrum for a sample of the optically active molecule. The sample spectrum is a sample state vector of the optically active molecule. A controller determines a plurality of estimate state vectors based on a plurality of perturbed intrinsic state vectors. Each of the plurality of perturbed intrinsic state vectors corresponds to a perturbed intrinsic structure. An optimum proportion of the plurality of perturbed intrinsic state vectors corresponds to each estimate state vector. The plurality estimate state vectors are matched against the sample state vector to determine a best match estimate state vector. The optimum proportion of the best matched estimate state vector is the proportion of the perturbed intrinsic molecular structures in the sample of the optically active molecule.