The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 1997
Filed:
Nov. 21, 1994
Heimo Keranen, Oulu, FI;
Mika Christophliemk, Oulu, FI;
Spectra-Physics Visiontech Oy, Oulu, FI;
Abstract
A calibration method especially for calibrating a reflection spectrometric gauge, such as an oil film gauge. In the method, calibration is conducted by measuring the gauge response by means of a calibration unit and a solid, stable permanent sample (37) provided on it as a calibration sample. A change that simulates a certain substance concentration is generated by the stable permanent sample (37) in the reflection spectrum, and the gauge response is calibrated on the basis thereof. In the invention, the gauge response is calibrated by using at least two calibration samples (37, 39) having different absorption responses, said two calibration samples being said permanent sample (37) and a second calibration sample (39). For calibration, roughness compensation is performed, in which the gauge response is corrected on the basis of the measurement of the optical response of the surface to be measured and the known data on roughness dependence.