The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 1997
Filed:
Sep. 07, 1994
Fumio Ohtomo, Tokyo-to, JP;
Kunihiro Hayashi, Tokyo-to, JP;
Jun-ichi Kodaira, Tokyo-to, JP;
Hiroyuki Nishizawa, Tokyo-to, JP;
Ken-ichiro Yoshino, Tokyo-to, JP;
Satoshi Hirano, Tokyo-to, JP;
Yohei Ogawa, Tokyo-to, JP;
Kabushiki Kaisha TOPCON, Tokyo-to, JP;
Abstract
The present invention provides an object reflector detection system, in which laser beam is emitted toward an object reflector and reflection light beam is received to detect presence or absence and position of the object reflector, whereby there are provided a laser beam emitter and a reflection light beam detector, and further a laser beam emitter for emitting polarized irradiation light beam toward the object reflector, and a reflection light beam detector for detecting polarized reflection light beam from the object reflector, and the reflection light beam detector having a first detection means for detecting polarized reflection light beam from the object reflector, a second detection means for detecting polarized light beam different from the polarized reflection light beam from the object reflector and a reflection light beam detection circuit for identifying the object reflector based on comparison between output of the first detection means and output of the second detection means.