The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 1997

Filed:

Oct. 18, 1995
Applicant:
Inventors:

Kiichi Suyama, Yokohama, JP;

Hajime Furusawa, Tokyo, JP;

Yasuharu Hosohara, Yokohama, JP;

Takashi Kobori, Yokohama, JP;

Assignee:

Tokyo Gas Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324635 ;
Abstract

A method of measuring the inner diameter of a pipe includes the steps of continuously transmitting RF waves of a predetermined frequency band from an antenna of a transmitter located inside of the pipe to be inspected, receiving the RF waves with an antenna of a receiver located inside the pipe, the antenna of the receiver being spaced apart from the antenna of the transmitter by a predetermined distance, detecting a frequency at a change point where an intensity of the received RF wave changes greatly, and substituting the frequency at the change point into a formula: d=c/1.706f (wherein d is the inner diameter of the pipe, c is the velocity of light, and f is the frequency at the change point) which shows the relation between the inner diameter of the pipe and the frequency to obtain a minimum inner diameter of the pipe.


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