The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 1997

Filed:

Jan. 10, 1994
Applicant:
Inventors:

Toshiaki Aritomi, Katsuta, JP;

Tuyosi Shudo, Katsuta, JP;

Syouji Kondou, Katsuta, JP;

Kazuo Suzuki, Katsuta, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
1286532 ; 324309 ;
Abstract

An external trigger method in a magnetic resonance inspection apparatus includes the steps of inputting collectively imaging control data including an imaging portion of a subject, the kind of sequences, a time interval between the sequences and the number of times of repetition of the sequences, executing a pre-processing sequence corresponding to the imaging sequence set to be first executed, and checking whether the time interval until the start of the imaging sequence to be next executed is set to a predetermined value. The imaging sequence is started by an external trigger when the time interval is set to the indefinite value. The imaging sequence is started after the passage of the time of the predetermined value when the time interval is set to the predetermined value.


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