The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 1997
Filed:
Dec. 14, 1994
Taisuke Hirono, Chofu, JP;
Kenkichi Ueda, Chofu, JP;
Kowa Company Ltd., , JP;
Abstract
An ophthalmic measurement apparatus for measuring biological properties by scanning the anterior chamber of an eye two-dimensionally with a laser beam. Light received from the anterior chamber is measured at a plurality of measurement points in a target measurement range defined by the two-dimensional scanning. A representative background value at each of the measurement points is calculated from the received light and compared with a reference value to provide an alignment rank level indicative of the state of alignment. The state of alignment is determined according to the alignment rank level. A difference value between the representative background values or a standard deviation at the measuring points is calculated and compared with an associated reference value for improving the determination of the state of alignment.