The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 1997
Filed:
Jan. 05, 1996
Ichiro Ueda, Yokohama, JP;
Masanori Ishizuka, Yokohama, JP;
Nippon Yusen Kaisha, Tokyo, JP;
Abstract
An environmental test apparatus comprising a substrate on which a test specimen is mounted securely, a cover disposed on the substrate for housing the test specimen within a tightly closed space thereof, a temperature/moisture adjusting system for adjusting temperature and moisture in the tightly closed space, a memory for storing control data such as accumulated past data or various kinds of environment reproduing data, a control system for controlling the temperature/moisture adjusting system based on the control data stored in the memory and a data measuring system for measuring and recording various kind of data for environmental test. Since the test specimen is disposed in the tightly closed space and temperature and moisture in the space are controlled based on the control data such as the past accumulated data or various kinds of environment reproducing data, test, for example, on transportation, storage or accumulation can be conducted with no actual experience of such an environment but under simulated environmental conditions relevant thereto, so that the effects of the environmental conditions on the cargos can be specified scientifically and accurately.