The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 1997
Filed:
Nov. 09, 1994
Naoji Yamaoka, Sayama, JP;
Koji Oda, Sayama, JP;
Honda Giken Kogyo Kabushiki Kaisha, Tokyo, JP;
Abstract
An optical measuring method for measuring a position of an edge portion of a workpiece uses an optical measuring apparatus having a projector for radiating a slit light on the workpiece and an image sensing device for picturing an optical cutting image drawn by the slit light radiated on the workpiece. The measuring is made from a pictured optical cutting image on a screen of the image sensing device. In the method, coordinates of an end point on a side of an edge portion of the pictured optical cutting image are obtained. Windows are set in predetermined two positions in that portion of the pictured optical cutting image which extends straight. Coordinates of respective centers of gravity of the pictured optical cutting image inside both the windows are obtained. An equation of a first straight line which passes through both the centers of gravity and an equation of a second straight line which crosses the first straight line at right angles and which passes through the end point are obtained. Coordinates of a crossing point of both the straight lines are obtained.