The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 1997
Filed:
Nov. 17, 1994
Robert S Gilmore, Burnt Hills, NY (US);
Patrick J Howard, Cincinnati, OH (US);
General Electric Company, Schenectady, NY (US);
Abstract
The method of producing a binary flaw-no flaw image of an object, including employing an ultrasonic data acquisition system to obtain data values f(i,j) which define a C-scan image (F) of the object, dividing the C-scan image (F) into a plurality of subimages (G.sub.k for k=1,2, . . . ,K), determining regional threshold levels y(k) for each of the plurality of subimages, using said regional threshold levels y(k) to determine pixel threshold levels t(i,j) for each pixel (i,j) of the image (F) by interpolation, and generating a binary flaw-no flaw image (B) by assigning binary values thereto based on a comparison between the pixel threshold levels t(i,j) and data values f(i,j), thereby providing a method which achieves a high probability of flaw detection and a low probability of false flaw indications.