The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 1997
Filed:
Aug. 10, 1995
Applicant:
Inventors:
David D Yao, Yorktown Heights, NY (US);
Jinfa Chen, New York, NY (US);
Shaohui Zheng, New York, NY (US);
Assignee:
The Trustees of Columbia University, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364552 ; 395210 ;
Abstract
A batch of units of a product are inspected before they are supplied to customers with warranties. The units are either defective or non-defective, realizing a defect index which is a random variable characterized by a statistical distribution. During the inspection, the units identified as being defective are repaired. A dynamic inspection technique has been developed and can be used to identify different thresholds for which number of units within a batch need to be inspected, such that costs due to the inspection, repair and warranty are minimized.