The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 1997

Filed:

Aug. 19, 1994
Applicant:
Inventors:

Robert R McClendon, Peoria, AZ (US);

Aleandro DiGianfilippo, Scottsdale, AZ (US);

Richard Pierce, Lake Zurich, IL (US);

Alan A Figler, Woodinville, WA (US);

Assignee:

Spectrel Partners, L.L.C., Phoenix, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F / ;
U.S. Cl.
CPC ...
364510 ; 364572 ; 36472401 ;
Abstract

The system and methods obtain a set of multiple data samples and derive an average of the data samples in the set (SET.sub.AVE). The systems and methods derive a standard deviation for the data samples in the set (SET.sub.STD). The systems and methods compare each of the data samples to SET.sub.STD and either reject the data sample, if the absolute difference between the data sample is greater than or equal to k * SET.sub.STD, where k is a selected value greater than zero, or retain the data sample, if the absolute difference between the data sample is less than k * SET.sub.STD. The systems and methods repeat the foregoing steps until the absolute difference between every data sample remaining in the set is less than k * SET.sub.STD. The systems and methods then derive a filtered average for the set FSET.sub.AVG, where FSET.sub.AVE is the SET.sub.AVG for the data set in which the absolute difference between every data sample remaining in the set is less than k * SET.sub.STD. The systems and methods find application in the calculation of pump flow rates, particularly using gravimetric calculation techniques.


Find Patent Forward Citations

Loading…