The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 1997

Filed:

Dec. 23, 1994
Applicant:
Inventor:

Thomas Mayer, Hohenems, AT;

Assignee:

Leica AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F16H / ; G02B / ;
U.S. Cl.
CPC ...
359392 ; 359393 ; 74409 ;
Abstract

A guide device for the backlash-free alignment of mutually relatively displaceable parts of an optical instrument, preferably of a rack-and-pinion housing of a microscope on a profile column. The rack-and-pinion housing is constructed with a gearing such that it can be moved along the profile column. Arranged between the rack-and-pinion housing and the profile column are a plurality of sliding elements (8), which are firstly constructed resiliently and form a force-closed connection between the rack-and-pinion housing and the profile column. For the purpose of fixing in the rack-and-pinion housing, the sliding elements (8) have a receptacle (11) for inserting an adhesive. After curing the adhesive, the sliding elements (8) lose their spring action.


Find Patent Forward Citations

Mayer, Thomas. (1997). Guide device and method for the backlash-free alignment of mutually (U.S. Patent No. 5608573). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5608573

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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