The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 1997

Filed:

Jan. 31, 1995
Applicant:
Inventor:

Robert B Miller, Albuquerque, NM (US);

Assignee:

The Titan Corporation, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04K / ;
U.S. Cl.
CPC ...
342 13 ; 342 14 ; 315-541 ; 315500 ; 378-1 ;
Abstract

An electron beam is generated in a packetized form defined by pulses having a duty cycle of less than 1:1000. Each pulse may have a width of approximately one microsecond (1 .mu.sec.) and may be separated by approximately one (1) second from the next pulse. The electrical beam may be accelerated, preferably linearly. The electrical beam may be modulated at a particular frequency (e.g. 3 gigahertz) by bunching the electrons during the beam acceleration. The electrons may be converted to photons (e.g. X-rays) by directing the electron beam to a target made from a suitable material (e.g. tungsten). The photons are then interacted with the electrical circuitry to produce photoelectrons. The photoelectrons impair the operation of the electronic circuitry by generating an electrical current in the electrical circuitry, generating capacitive charges in the circuitry and generating an electromagnetic field in the vicinity of the circuitry. The electrical circuitry may be disposed within an enclosure substantially impervious to the penetration of external electromagnetic fields, but passing energetic photons (x-rays). The enclosure may resonate at the modulating frequency. This invention is primarily intended to be used for experimental purposes to determine how the electrical circuitry may be protected to prevent the electrical circuitry from being operationally impaired by photons passing to the electrical circuitry.


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