The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 1997
Filed:
Jun. 06, 1995
Irwin L Newberg, Northridge, CA (US);
Gene A Wagner, Torrance, CA (US);
Gene Rzyski, Cypress, CA (US);
Richard A Stevens, West Hills, CA (US);
Hughes Electronics, Los Angeles, CA (US);
Abstract
A noise measurement test system 10' for making phase noise and amplitude noise measurements of microwave signals derived from a continuous wave RF source. The system 10' comprises an RF input for receiving an applied RF noise signal and an RF coupler 11 coupled to the RF input for splitting the applied RF noise signal into first and second paths 18a, 18b. A mixer 15 that comprises a synchronous phase detector 15 is coupled to receive signals from the first and second paths 18a, 18b, respectively, and which outputs demodulated phase noise. The first path 18a comprises a variable attenuator 14 and a variable phase shifter 13 coupled between the coupler 11 and the first input of the mixer 15 for providing a reference signal input to the synchronous detector 15. The second path 18b comprises a delay line and an adjustable RF carrier nulling circuit 30 coupled between the coupler 11 and the mixer 15. A video amplifier is coupled to an output of the mixer 15 for providing a baseband video output signal from the system 10' that is processed to produce noise data.