The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 1997
Filed:
Feb. 02, 1995
William R Clouse, III, Corpus Christi, TX (US);
Robert X Perez, Corpus Christi, TX (US);
Gary E Heath, Odem, TX (US);
All Tech Inspection, Inc., Corpus Christi, TX (US);
Abstract
A Harsh Environment Tag (HET) and associated data collection system are provided that allow the identification, classification, and description of industrial, architectural, and machine equipment within harsh process environments. Each tag consists of a longitudinally arranged array of non-corrosive modules with standardized dimensional variations that are associated with alpha-numerically encoded values. Each tag may be rigidly or loosely affixed to a particular object for the purposes of inventory, inspection, and maintenance. Each tag may be scanned or read or by a transducer configured to detect the specific variations within which the coded information is retained. The coded values are then interpreted by a microprocessor based device capable of associating the coded values with either prerecorded identities and characteristics or with such information as may be input in association with the scan of a particular tag. The system and the tags associated with the system are appropriate for inventory, inspection, and maintenance purposes within industrial, architectural, and machine systems located within harsh environments.