The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 1997

Filed:

Nov. 13, 1995
Applicant:
Inventor:

Armen P Sarvazyan, East Brunswick, NJ (US);

Assignee:

Artann Corporation, a NJ Corp., East Brunswick, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
12866002 ;
Abstract

A method and devices for Shear Wave Elasticity Imaging (SWEI). The method employs a focused ultrasound transducer which remotely induces a shear wave in a tissue by sending modulated ultrasonic pulses. The shear wave of the frequency of the modulating signal is detected. The values of the shear modulus and dynamic shear viscosity of tissue are evaluated from the measured values of velocity and attenuation of shear waves. Several devices for carrying out the method are described. Devices based on the method can be used as a diagnostic tool in the detection of abnormalities in tissue, such as those caused by cancer or other lesions and characterizing processes in tissues accompanied by changes in their mechanical properties.


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