The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 1997

Filed:

Jun. 05, 1995
Applicant:
Inventors:

Douglas C Neckers, Perrysburg, OH (US);

Jian C Song, Bowling Green, OH (US);

Afranio Torres-Filho, Bowling Green, OH (US);

Wolter F Jager, Bowling Green, OH (US);

Zhijun J Wang, Bowling Green, OH (US);

Assignee:

Spectra Group Limited, Inc., Maumee, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2504591 ; 250302 ; 2504581 ; 2504611 ;
Abstract

A method for monitoring a property of a polymeric mass such as a coating or film comprising the steps of adding a fluorescence probe compound capable of fluorescing to a polymeric composition which has the ability to undergo changes in microviscosity, the ratio of the intensity of the fluorescence emission of said compound at two wavelengths changing in response to said changes in said microviscosity of said composition; curing said composition; causing said compound to fluoresce; measuring the fluorescence of said compound; calculating the ratio of the intensities of fluorescence emission of said compound at two or more wavelengths; relating said ratio to the monitored property of said composition.


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