The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 1997

Filed:

Sep. 06, 1994
Applicant:
Inventors:

Shuh-Haw Sheen, Naperville, IL (US);

Hual-Te Chien, Naperville, IL (US);

Apostolos C Raptis, Downers Grove, IL (US);

Assignee:

The University of Chicago, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
73 3 / ; 73597 ; 73159 ; 19240 ;
Abstract

Methods and apparatus are provided for monitoring sliver and yarn characteristics. Transverse waves are generated relative to the sliver or yarn. At least one acoustic sensor is in contact with the sliver or yarn for detecting waves coupled to the sliver or yarn and for generating a signal. The generated signal is processed to identify the predefined characteristics including sliver or yarn linear density. The transverse waves can be generated with a high-powered acoustic transmitter spaced relative to the sliver or yarn with large amplitude pulses having a central frequency in a range between 20 KHz and 40 KHz applied to the transmitter. The transverse waves can be generated by mechanically agitating the sliver or yarn with a tapping member.


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