The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 1997
Filed:
Feb. 08, 1996
Masakazu Suzuki, Kyoto, JP;
Keisuke Mori, Kyoto, JP;
Akifumi Tachibana, Kyoto, JP;
Kazunari Matoba, Kyoto, JP;
Hitoshi Asai, Hamamatsu, JP;
Kazuhisa Miyaguchi, Hamamatsu, JP;
Toshitaka Takeguchi, Shizuoka, JP;
J. Morita Manufacturing Corporation, Kyoto, JP;
Hamamatsu Photonics Kabushiki Kaisha, Shizuoka, JP;
Abstract
The present invention provides an X-ray tomographic imaging apparatus, wherein image degrading components caused by a CCD sensor (3c) or the like are reduced so as to obtain high-quality X-ray images. After tomographic imaging, dark current noise is eliminated by subtracting dark current correction data from a specific line of data among image data stored in an image memory. Next, sensitivity correction coefficients are prepared on the basis of data obtained when an X-ray beam having nearly uniform intensity distribution enters an X-ray imaging device 3. The image data obtained after dark current correction is then multiplied by the sensitivity correction coefficients. As a result, noise due to sensitivity variations or the like can be eliminated.