The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 1997
Filed:
Mar. 20, 1995
Applicant:
Inventors:
David L Byron, Honeoye Falls, NY (US);
Rory L Flemmer, Independence, WV (US);
Assignee:
Bausch & Lomb Incorporated, Rochester, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356124 ; 356394 ; 356243 ; 346125 ; 346129 ;
Abstract
A lens inspection system 10 has two cameras 50, 51 for capturing plan and edge images views of a lens 20 and providing pixel data signals representative of the images. The pixel data signals corresponding to the plan and edge images are analyzed by a computer 70. The computer uses the pixel data signals to calculate the circumference of the image, the lengths of radii to circumferential pixels, and the bevel angle of the lens 20. Such data are compared to data stored in memory 710 and a visual display 74 indicates the difference between the image and the stored data.