The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 1997

Filed:

May. 05, 1995
Applicant:
Inventors:

Hiroshi Sukegawa, Tokyo, JP;

Yasunori Maki, Tokyo, JP;

Takashi Inagaki, Tokyo, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
395430 ; 395404 ;
Abstract

A NAND bus interface independently receives 16 ready/busy signals from 16 flash EEPROM chips and thereby separately manages the operating states of these flash EEPROMs. Once a flash EEPROM as a write access target is set in a ready state, a write access to this write access target flash EEPROM is started without waiting for completion of the operations of all the flash EEPROMs. Each flash EEPROM is of a command control type capable of automatically executing a write operation. This allows parallel processing of the flash EEPROMs, i.e., a write access to a given EEPROM can be performed while a data write to another flash EEPROM is being executed. An ECC calculating circuit calculates a data string transferred in units of 256 bytes from a data buffer by a processor, and generates an ECC corresponding to that data string. The 256-byte data string is added with the generated ECC and transferred to a data register of a flash EEPROM. Even if abnormal cells are produced at the same bit position in a plurality of pages of a flash EEPROM, only one abnormal cell is contained in a data string as an object of the ECC calculation. This makes it possible to perform error detection and correction by a common simple ECC calculation without using any complicated ECC arithmetic expression with a high data recovery capability.

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