The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 1997
Filed:
Nov. 30, 1995
Fujitsu Limited, Kanagawa, JP;
Abstract
A test system exactly checks the integrity of data in an ATM system, and generates a test cell of a desired band. In the first aspect of the system in which data stored in an ATM cell are transmitted in an 8-bit parallel format in the ATM system, a test cell generating device connected to an input line outputs a test cell having 1 in all of the eight bits or having zero in all of the eight bits, and the test cell confirming device connected to an output line of the ATM switch detects the above described data. In the second aspect, the test cell generating device provided in an input trunk outputs a test cell of a desired band based on a ratio between two optional integers N and n (N.gtoreq.n), the state of a buffer of the ATM switch is monitored, and a load test is conducted to determine whether or not any cell has been destroyed.