The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 1997
Filed:
Nov. 27, 1995
Kexin Xu, Kyoto, JP;
Yutaka Yamasaki, Kyoto, JP;
Harumi Uenoyama, Kyoto, JP;
Takeshi Sakura, Kyoto, JP;
Kyoto Daiichi Kagaku Co., Ltd., Kyoto-fu, JP;
Abstract
An apparatus and method for optically measuring concentrations of components allow enhancement in measurement accuracy of concentration. The apparatus includes a cell, a light irradiator, a photodetector, and an arithmetic unit. The cell presents different optical path lengths at different locations and is to contain a sample therein. The light irradiator, which includes a variable-wavelength laser generator and a measuring system composed of convex lenses, outputs a collimated, enlarged laser beam, and makes the laser beam incident upon the cell. The photodetector comprises a multiplicity of photodetectors arranged in parallel to the surface of the cell, so that it can detect intensity of rays of transmitted light that have traveled over different optical path lengths at positions of an equal distance from the cell. The arithmetic unit, receiving a signal from the individual photodetectors, calculates concentrations of components in the sample based on optimum optical path lengths for different wavelengths and values of transmitted light at positions of the optimum optical path lengths, and further outputs calculation results.